Tera Probe, Inc. engages in wafer testing, final testing, testing technology development, and worker dispatching both in Japan and internationally. It offers wafer test and final test services for various semiconductor products, including dynamic random access memory (DRAM), system on a chip (SoC), CPUs, image sensors, and analog/mixed devices. The company also designs and develops probe cards and mass production setups. Tera Probe was founded on August 4, 2005, Tera Probe is headquartered in Yokohama, Japan.